Seagate ST9120827AS Manual do Utilizador

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:service@quiete

Report No： 084061R-ITCEP07V04 Page: 7 of 191 1. General Information 1.1. EUT Description Product Name Notebook Trade Name MSI Model No. MS-164

Report No： 084061R-ITCEP07V04 Page: 97 of 191 Test Mode : Mode 3: Description : Front View of ISN Test - Telecom Test Mode : Mode 3: Desc

Report No： 084061R-ITCEP07V04 Page: 98 of 191 Test Mode : Mode 3: Description : Front View of ISN Test - 1G Test Mode : Mode 3: Descript

Report No： 084061R-ITCEP07V04 Page: 99 of 191 5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN 55022 5.2. Test Setu

Report No： 084061R-ITCEP07V04 Page: 100 of 191 5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above

Report No： 084061R-ITCEP07V04 Page: 101 of 191 5.6. Test Result Site : OATS-3 Time : 2008/04/28 - 10:15 Limit : CISPR_B_10M_QP Margin : 6 EUT : N

Report No： 084061R-ITCEP07V04 Page: 102 of 191 Site : OATS-3 Time : 2008/04/28 - 10:38 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe :

Report No： 084061R-ITCEP07V04 Page: 103 of 191 Site : OATS-3 Time : 2008/04/02 - 13:37 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe :

Report No： 084061R-ITCEP07V04 Page: 104 of 191 Site : OATS-3 Time : 2008/04/02 - 14:08 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe :

Report No： 084061R-ITCEP07V04 Page: 105 of 191 Site : OATS-3 Time : 2008/04/25 - 16:32 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe :

Report No： 084061R-ITCEP07V04 Page: 106 of 191 Site : OATS-3 Time : 2008/04/25 - 16:02 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe :

Report No： 084061R-ITCEP07V04 Page: 8 of 191 WD1600BEVS WD2500BEVS HTS541612J9SA00 Hitachi HTS541616J9SA00 ST9160824AS ST9250827AS ST9160821AS Se

Report No： 084061R-ITCEP07V04 Page: 107 of 191 5.7. Test Photograph Test Mode : Mode 1: Description : Front View of Radiated Test Test Mode

Report No： 084061R-ITCEP07V04 Page: 108 of 191 Test Mode : Mode 2: Description : Front View of Radiated Test Test Mode : Mode 2: Descript

Report No： 084061R-ITCEP07V04 Page: 109 of 191 Test Mode : Mode 3: Description : Front View of Radiated Test Test Mode : Mode 3: Descrip

Report No： 084061R-ITCEP07V04 Page: 110 of 191 6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN 61000-3-2 6

Report No： 084061R-ITCEP07V04 Page: 111 of 191 (b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current

Report No： 084061R-ITCEP07V04 Page: 112 of 191 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having th

Report No： 084061R-ITCEP07V04 Page: 113 of 191 6.6. Test Result Product Notebook Test Item Power Harmonics Test Mode Mode 1: Date of Test 20

Report No： 084061R-ITCEP07V04 Page: 114 of 191 Test Result: Pass Source qualification: Normal THC(A): 0.19 I-THD(%): 49.91

Report No： 084061R-ITCEP07V04 Page: 115 of 191 Product Notebook Test Item Power Harmonics Test Mode Mode 2: Date of Test 2008/04/07 Test Si

Report No： 084061R-ITCEP07V04 Page: 116 of 191 Test Result: Pass Source qualification: Normal THC(A): 0.21 I-THD(%): 50.21

Report No： 084061R-ITCEP07V04 Page: 9 of 191 LITEON PA-1900-04 ADP-90SB AB 90 W Adapter DELTA ADP-90SB BB LSI D40 Modem Motorola ML3054 NVCP

Report No： 084061R-ITCEP07V04 Page: 117 of 191 Product Notebook Test Item Power Harmonics Test Mode Mode 3: Date of Test 2008/04/29 Test Si

Report No： 084061R-ITCEP07V04 Page: 118 of 191 Test Result: Pass Source qualification: Normal THC(A): 0.06 I-THD(%): 13.94

Report No： 084061R-ITCEP07V04 Page: 119 of 191 6.7. Test Photograph Test Mode : Mode 1: Description : Power Harmonics Test Setup Test Mode

Report No： 084061R-ITCEP07V04 Page: 120 of 191 Test Mode : Mode 3: Description : Power Harmonics Test Setup

Report No： 084061R-ITCEP07V04 Page: 121 of 191 7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN 61000-

Report No： 084061R-ITCEP07V04 Page: 122 of 191 c) 7 ％ for equipment which is: － attended whilst in use (for example: hair dryers, vacuum cleaners

Report No： 084061R-ITCEP07V04 Page: 123 of 191 7.6. Test Result Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 1:

Report No： 084061R-ITCEP07V04 Page: 124 of 191 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 2: Date of Test 20

Report No： 084061R-ITCEP07V04 Page: 125 of 191 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 3: Date of Test 20

Report No： 084061R-ITCEP07V04 Page: 126 of 191 7.7. Test Photograph Test Mode : Mode 1: Description : Flicker Test Setup Test Mode : Mode 2

Report No： 084061R-ITCEP07V04 Page: 10 of 191 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All

Report No： 084061R-ITCEP07V04 Page: 127 of 191 Test Mode : Mode 3: Description : Flicker Test Setup

Report No： 084061R-ITCEP07V04 Page: 128 of 191 8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC 61000-4-2 8.2. Te

Report No： 084061R-ITCEP07V04 Page: 129 of 191 8.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only

Report No： 084061R-ITCEP07V04 Page: 130 of 191 8.6. Test Result Product Notebook Test Item Electrostatic Discharge Test Mode Mode 1: Date of

Report No： 084061R-ITCEP07V04 Page: 131 of 191 Product Notebook Test Item Electrostatic Discharge Test Mode Mode 2: Date of Test 2008/04/08

Report No： 084061R-ITCEP07V04 Page: 132 of 191 Product Notebook Test Item Electrostatic Discharge Test Mode Mode 3: Date of Test 2008/05/01

Report No： 084061R-ITCEP07V04 Page: 133 of 191 8.7. Test Photograph Test Mode : Mode 1: Description : ESD Test Setup Test Mode : Mode 2: De

Report No： 084061R-ITCEP07V04 Page: 134 of 191 Test Mode : Mode 3: Description : ESD Test Setup

Report No： 084061R-ITCEP07V04 Page: 135 of 191 9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC 61000-4-3 9.2. Te

Report No： 084061R-ITCEP07V04 Page: 136 of 191 9.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, a

Report No： 084061R-ITCEP07V04 Page: 11 of 191 ITEM MODE 3 (LCD+CRT/1280*800) MODE 4 (LCD+CRT/1280*800) CPU PENRYN,P8600(QASB),2.4GHz PENRYN,P840

Report No： 084061R-ITCEP07V04 Page: 137 of 191 9.6. Test Result Product Notebook Test Item Radiated susceptibility Test Mode Mode 1: Date of

Report No： 084061R-ITCEP07V04 Page: 138 of 191 Product Notebook Test Item Radiated susceptibility Test Mode Mode 2: Date of Test 2008/04/07

Report No： 084061R-ITCEP07V04 Page: 139 of 191 Product Notebook Test Item Radiated susceptibility Test Mode Mode 3: Date of Test 2008/04/30

Report No： 084061R-ITCEP07V04 Page: 140 of 191 9.7. Test Photograph Test Mode : Mode 1: Description : Radiated Susceptibility Test Setup Tes

Report No： 084061R-ITCEP07V04 Page: 141 of 191 Test Mode : Mode 3: Description : Radiated Susceptibility Test Setup

Report No： 084061R-ITCEP07V04 Page: 142 of 191 10. Electrical Fast Transient/Burst 10.1. Test Specification According to Standard : IEC 61000-4

Report No： 084061R-ITCEP07V04 Page: 143 of 191 10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference pla

Report No： 084061R-ITCEP07V04 Page: 144 of 191 10.6. Test Result Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 1

Report No： 084061R-ITCEP07V04 Page: 145 of 191 Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 2: Date of Test 20

Report No： 084061R-ITCEP07V04 Page: 146 of 191 Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 2: Date of Test 20

Report No： 084061R-ITCEP07V04 Page: 12 of 191 ITEM MODE 7 (LCD+CRT/1280*800) MODE 8 (LCD+CRT/1280/800) CPU PENRYN,T9400(QAEL),2.53GHz PENRYN,P86

Report No： 084061R-ITCEP07V04 Page: 147 of 191 10.7. Test Photograph Test Mode : Mode 1: Description : EFT/B Test Setup Test Mode : Mode 1

Report No： 084061R-ITCEP07V04 Page: 148 of 191 Test Mode : Mode 2: Description : EFT/B Test Setup Test Mode : Mode 2: Description : EFT/B

Report No： 084061R-ITCEP07V04 Page: 149 of 191 Test Mode : Mode 3: Description : EFT/B Test Setup Test Mode : Mode 3: Description : EFT/B

Report No： 084061R-ITCEP07V04 Page: 150 of 191 11. Surge 11.1. Test Specification According to Standard : IEC 61000-4-5 11.2. Test Setup 1

Report No： 084061R-ITCEP07V04 Page: 151 of 191 11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal g

Report No： 084061R-ITCEP07V04 Page: 152 of 191 11.6. Test Result Product Notebook Test Item Surge Test Mode Mode 1: Date of Test 2008/04/08

Report No： 084061R-ITCEP07V04 Page: 153 of 191 Product Notebook Test Item Surge Test Mode Mode 2: Date of Test 2008/04/08 Test Site No.6

Report No： 084061R-ITCEP07V04 Page: 154 of 191 Product Notebook Test Item Surge Test Mode Mode 3: Date of Test 2008/05/01 Test Site No.6

Report No： 084061R-ITCEP07V04 Page: 155 of 191 11.7. Test Photograph Test Mode : Mode 1: Description : SURGE Test Setup Test Mode : Mode 2

Report No： 084061R-ITCEP07V04 Page: 156 of 191 Test Mode : Mode 3: Description : SURGE Test Setup

Report No： 084061R-ITCEP07V04 Page: 13 of 191 ITEM MODE 11 (LCD+CRT/1280*800) MODE 12 (LCD+CRT/1280*800) CPU PENRYN,T9600(QAER),2.8GHz PENRYN,T9

Report No： 084061R-ITCEP07V04 Page: 157 of 191 12. Conducted Susceptibility 12.1. Test Specification According to Standard : IEC 61000-4-6 12.

Report No： 084061R-ITCEP07V04 Page: 158 of 191 12.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Signal Po

Report No： 084061R-ITCEP07V04 Page: 159 of 191 12.6. Test Result Product Notebook Test Item Conducted susceptibility Test Mode Mode 1: Date

Report No： 084061R-ITCEP07V04 Page: 160 of 191 Product Notebook Test Item Conducted susceptibility Test Mode Mode 2: Date of Test 2008/04/0

Report No： 084061R-ITCEP07V04 Page: 161 of 191 Product Notebook Test Item Conducted susceptibility Test Mode Mode 3: Date of Test 2008/04/3

Report No： 084061R-ITCEP07V04 Page: 162 of 191 12.7. Test Photograph Test Mode : Mode 1: Description : Conducted Susceptibility Test Setup

Report No： 084061R-ITCEP07V04 Page: 163 of 191 Test Mode : Mode 2: Description : Conducted Susceptibility Test Setup Test Mode : Mode 2:

Report No： 084061R-ITCEP07V04 Page: 164 of 191 Test Mode : Mode 3: Description : Conducted Susceptibility Test Setup Test Mode : Mode 3:

Report No： 084061R-ITCEP07V04 Page: 165 of 191 13. Power Frequency Magnetic Field 13.1. Test Specification According to Standard : IEC 61000-4-

Report No： 084061R-ITCEP07V04 Page: 166 of 191 13.6. Test Result Product Notebook Test Item Power frequency magnetic field Test Mode Mode 1:

Report No： 084061R-ITCEP07V04 Page: 14 of 191 ITEM MODE 15 (LCD+CRT/1280*800) MODE 16 (LCD+CRT/1280*800) CPU INTEL/P9500 2.53G PENRYN,T9600(QAER

Report No： 084061R-ITCEP07V04 Page: 167 of 191 Product Notebook Test Item Power frequency magnetic field Test Mode Mode 2: Date of Test 200

Report No： 084061R-ITCEP07V04 Page: 168 of 191 Product Notebook Test Item Power frequency magnetic field Test Mode Mode 3: Date of Test 200

Report No： 084061R-ITCEP07V04 Page: 169 of 191 13.7. Test Photograph Test Mode : Mode 1: Description : Power Frequency Magnetic Field Test S

Report No： 084061R-ITCEP07V04 Page: 170 of 191 Test Mode : Mode 3: Description : Power Frequency Magnetic Field Test Setup

Report No： 084061R-ITCEP07V04 Page: 171 of 191 14. Voltage Dips and Interruption 14.1. Test Specification According to Standard : IEC 61000-4-1

Report No： 084061R-ITCEP07V04 Page: 172 of 191 14.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal g

Report No： 084061R-ITCEP07V04 Page: 173 of 191 14.6. Test Result Product Notebook Test Item Voltage dips and interruption Test Mode Mode 1:

Report No： 084061R-ITCEP07V04 Page: 174 of 191 Product Notebook Test Item Voltage dips and interruption Test Mode Mode 2: Date of Test 2008/

Report No： 084061R-ITCEP07V04 Page: 175 of 191 Product Notebook Test Item Voltage dips and interruption Test Mode Mode 3: Date of Test 2008

Report No： 084061R-ITCEP07V04 Page: 176 of 191 14.7. Test Photograph Test Mode : Mode 1: Description : Voltage Dips Test Setup Test Mode

Report No： 084061R-ITCEP07V04 Page: 15 of 191 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the

Report No： 084061R-ITCEP07V04 Page: 177 of 191 Test Mode : Mode 1: Description : Voltage Dips Test Setup

Report No： 084061R-ITCEP07V04 Page: 178 of 191 15. Attachment  EUT Photograph (1) EUT Photo (2) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 179 of 191 (3) EUT Photo (4) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 180 of 191 (5) EUT Photo (6) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 181 of 191 (7) EUT Photo (8) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 182 of 191 (9) EUT Photo (10) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 183 of 191 (11) EUT Photo (12) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 184 of 191 (13) EUT Photo (14) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 185 of 191 (15) EUT Photo (16) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 186 of 191 (17) EUT Photo (18) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 16 of 191 1.4. Configuration of Tested System Connection Diagram Mode 1: Signal Cable Type Signal cable De

Report No： 084061R-ITCEP07V04 Page: 187 of 191 (19) EUT Photo (20) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 188 of 191 (21) EUT Photo (22) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 189 of 191 (23) EUT Photo (24) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 190 of 191 (25) EUT Photo (26) EUT Photo

Report No： 084061R-ITCEP07V04 Page: 191 of 191 (27) EUT Photo (28) EUT Photo

Test Report Product Name ：Notebook Model No. ：MS-1644, PR621, PR621X Applicant ： MICRO-STAR INT’L Co., LTD. Address ： No. 69, Li-De S

Report No： 084061R-ITCEP07V04 Page: 17 of 191 Connection Diagram Mode 2: Signal Cable Type Signal cable Description A RS-232 Cable Shielded,

Report No： 084061R-ITCEP07V04 Page: 18 of 191 Connection Diagram Mode 3: Signal Cable Type Signal cable Description A D-SUB Cable Shielded, 1

Report No： 084061R-ITCEP07V04 Page: 19 of 191 1.5. EUT Exercise Software 1 Setup the EUT and peripheral as shown on Figure 2 Connect the power t

Report No： 084061R-ITCEP07V04 Page: 20 of 191 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviatio

Report No： 084061R-ITCEP07V04 Page: 21 of 191 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No

Report No： 084061R-ITCEP07V04 Page: 22 of 191 Electrostatic Discharge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulato

Report No： 084061R-ITCEP07V04 Page: 23 of 191 Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaff

Report No： 084061R-ITCEP07V04 Page: 24 of 191 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26

Report No： 084061R-ITCEP07V04 Page: 25 of 191 Conducted susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IE

Report No： 084061R-ITCEP07V04 Page: 26 of 191 2.4. Test Environment Performed Item Items Required Actual Temperature (°C) 15-35 25 Conducted

Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Appr

Report No： 084061R-ITCEP07V04 Page: 27 of 191 Temperature (°C) 15-35 21.1 Power frequency magnetic field Humidity (%RH) 25-75 50 Barometric p

Report No： 084061R-ITCEP07V04 Page: 28 of 191 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN 5502

Report No： 084061R-ITCEP07V04 Page: 29 of 191 3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance

Report No： 084061R-ITCEP07V04 Page: 30 of 191 3.6. Test Result Site : SR-1 Time : 2008/04/02 - 03:38 Limit : CISPR_B_00M_QP Margin : 10 EUT : Not

Report No： 084061R-ITCEP07V04 Page: 31 of 191 Site : SR-1 Time : 2008/04/02 - 03:39 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 32 of 191 Site : SR-1 Time : 2008/04/02 - 03:39 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 33 of 191 Site : SR-1 Time : 2008/04/02 - 03:40 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : L

Report No： 084061R-ITCEP07V04 Page: 34 of 191 Site : SR-1 Time : 2008/04/02 - 03:40 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 35 of 191 Site : SR-1 Time : 2008/04/02 - 03:40 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 36 of 191 Site : SR-1 Time : 2008/04/02 - 03:44 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : L

QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601

Report No： 084061R-ITCEP07V04 Page: 37 of 191 Site : SR-1 Time : 2008/04/02 - 03:45 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 38 of 191 Site : SR-1 Time : 2008/04/02 - 03:45 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 39 of 191 Site : SR-1 Time : 2008/04/02 - 03:45 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : L

Report No： 084061R-ITCEP07V04 Page: 40 of 191 Site : SR-1 Time : 2008/04/02 - 03:46 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 41 of 191 Site : SR-1 Time : 2008/04/02 - 03:46 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 42 of 191 Site : SR-1 Time : 2008/04/26 - 07:10 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : L

Report No： 084061R-ITCEP07V04 Page: 43 of 191 Site : SR-1 Time : 2008/04/26 - 07:11 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 44 of 191 Site : SR-1 Time : 2008/04/26 - 07:11 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 45 of 191 Site : SR-1 Time : 2008/04/26 - 07:12 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : L

Report No： 084061R-ITCEP07V04 Page: 46 of 191 Site : SR-1 Time : 2008/04/26 - 07:12 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 2 of 191 Test Report Certification Issued Date : 2008/05/09 Report No. : 084061R-ITCEP07V04

Report No： 084061R-ITCEP07V04 Page: 47 of 191 Site : SR-1 Time : 2008/04/26 - 07:12 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : LI

Report No： 084061R-ITCEP07V04 Page: 48 of 191 3.7. Test Photograph Test Mode : Mode 1: Description : Front View of Conducted Test Test Mode

Report No： 084061R-ITCEP07V04 Page: 49 of 191 Test Mode : Mode 2: Description : Front View of Conducted Test Test Mode : Mode 2: Descript

Report No： 084061R-ITCEP07V04 Page: 50 of 191 Test Mode : Mode 3: Description : Front View of Conducted Test Test Mode : Mode 3: Descrip

Report No： 084061R-ITCEP07V04 Page: 51 of 191 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standar

Report No： 084061R-ITCEP07V04 Page: 52 of 191 4.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the

Report No： 084061R-ITCEP07V04 Page: 53 of 191 4.6. Test Result Site : SR-1 Time : 2008/04/03 - 15:36 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT

Report No： 084061R-ITCEP07V04 Page: 54 of 191 Site : SR-1 Time : 2008/04/03 - 15:38 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 55 of 191 Site : SR-1 Time : 2008/04/03 - 15:38 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 56 of 191 Site : SR-1 Time : 2008/04/03 - 15:27 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 3 of 191 Laboratory Information We , QuieTek Corporation, are an independent EMC and safety consultancy that w

Report No： 084061R-ITCEP07V04 Page: 57 of 191 Engineer : Site : SR-1 Time : 2008/04/03 - 15:28 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT :

Report No： 084061R-ITCEP07V04 Page: 58 of 191 Engineer : Site : SR-1 Time : 2008/04/03 - 15:28 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT :

Report No： 084061R-ITCEP07V04 Page: 59 of 191 Site : SR-1 Time : 2008/04/03 - 15:38 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 60 of 191 Site : SR-1 Time : 2008/04/03 - 15:47 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 61 of 191 Site : SR-1 Time : 2008/04/03 - 15:49 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 62 of 191 Site : SR-1 Time : 2008/04/03 - 15:49 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 63 of 191 Site : SR-1 Time : 2008/04/03 - 15:19 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 64 of 191 Site : SR-1 Time : 2008/04/03 - 15:21 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 65 of 191 Site : SR-1 Time : 2008/04/03 - 15:21 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 66 of 191 Site : SR-1 Time : 2008/04/03 - 15:04 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 4 of 191 TABLE OF CONTENTS Description Page 1.

Report No： 084061R-ITCEP07V04 Page: 67 of 191 Site : SR-1 Time : 2008/04/03 - 15:06 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 68 of 191 Site : SR-1 Time : 2008/04/03 - 15:06 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 69 of 191 Site : SR-1 Time : 2008/04/03 - 15:08 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 70 of 191 Site : SR-1 Time : 2008/04/03 - 15:10 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 71 of 191 Site : SR-1 Time : 2008/04/03 - 15:10 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 72 of 191 Site : SR-1 Time : 2008/04/03 - 14:44 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 73 of 191 Site : SR-1 Time : 2008/04/03 - 14:46 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 74 of 191 Site : SR-1 Time : 2008/04/03 - 14:46 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 75 of 191 Site : SR-1 Time : 2008/04/03 - 15:12 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 76 of 191 Site : SR-1 Time : 2008/04/03 - 15:14 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 5 of 191 6. Harmonic Current Emission ...

Report No： 084061R-ITCEP07V04 Page: 77 of 191 Site : SR-1 Time : 2008/04/03 - 15:14 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 78 of 191 Site : SR-1 Time : 2008/04/26 - 12:41 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 79 of 191 Site : SR-1 Time : 2008/04/26 - 12:44 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 80 of 191 Site : SR-1 Time : 2008/04/26 - 12:44 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 81 of 191 Site : SR-1 Time : 2008/04/26 - 12:34 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 82 of 191 Site : SR-1 Time : 2008/04/26 - 12:37 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 83 of 191 Site : SR-1 Time : 2008/04/26 - 12:37 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 84 of 191 Site : SR-1 Time : 2008/04/26 - 12:53 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 85 of 191 Site : SR-1 Time : 2008/04/26 - 12:54 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 86 of 191 Site : SR-1 Time : 2008/04/26 - 12:54 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 6 of 191 10.6. Test Result...

Report No： 084061R-ITCEP07V04 Page: 87 of 191 Site : SR-1 Time : 2008/04/26 - 12:15 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Report No： 084061R-ITCEP07V04 Page: 88 of 191 Site : SR-1 Time : 2008/04/26 - 12:17 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 89 of 191 Site : SR-1 Time : 2008/04/26 - 12:17 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Report No： 084061R-ITCEP07V04 Page: 90 of 191 4.7. Test Photograph Test Mode : Mode 1: Description : Front View of ISN Test Test Mode : M

Report No： 084061R-ITCEP07V04 Page: 91 of 191 Test Mode : Mode 1: Description : Front View of ISN Test - Telecom Test Mode : Mode 1: Desc

Report No： 084061R-ITCEP07V04 Page: 92 of 191 Test Mode : Mode 1: Description : Front View of ISN Test - 1G Test Mode : Mode 1: Descript

Report No： 084061R-ITCEP07V04 Page: 93 of 191 Test Mode : Mode 2: Description : Front View of ISN Test Test Mode : Mode 2: Description

Report No： 084061R-ITCEP07V04 Page: 94 of 191 Test Mode : Mode 2: Description : Front View of ISN Test - Telecom Test Mode : Mode 2: Desc

Report No： 084061R-ITCEP07V04 Page: 95 of 191 Test Mode : Mode 2: Description : Front View of ISN Test - 1G Test Mode : Mode 2: Descript

Report No： 084061R-ITCEP07V04 Page: 96 of 191 Test Mode : Mode 3: Description : Front View of ISN Test Test Mode : Mode 3: Description